author = "Jos{\'e} Carlos Campos Costa and Paulo Flores and Hor{\'a}cio C. Neto and J. Monteiro and Joao Marques Silva",
   title = "Exploiting Don't Cares in Test Patterns to Reduce Power During {BIST}",
   booktitle = "IEEE European Test Workshop",
   year = 1998,
   month = may,
   BibTexOrigem = "1917 www.Inesc-ID.pt 2019-06-16"

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