Cristiano Lazzari,

Inesc-ID

Abstract:

Deep submicron (DSM) technologies have increased the challenges in circuit designs. Radiation effects are more significant because particles with low energy, without effect in older technologies, may cause system failures in DSM circuits. The goal of this talk is to present a methodology by increasing the dependability of circuits under energetic particles. The methodology is based on changing the width of transistors that belongs to critical paths.

Cristiano Lazzari works as researcher in the ALGOS group at INESC-ID. He obtained his Ph.D. in December, 2007 from the Federal University of Rio Grande do Sul (UFRGS), Brazil and from the Institute National Polytechnique de Granoble (INPG), France. The main research area in his Ph.D. was algorithms and techniques for automatic layout generation and radiation-hardened circuit generation. In 2007, Lazzari worked at the CEITEC, Brazil as backend engineer, where he was responsible for logic and physical synthesis of digital circuits.u

 

Date: 2008-Mar-17     Time: 11:00:00     Room: 336


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