Jorge F. Villena,

Inesc-ID

Abstract:

This talk will describe an automatic methodology for optimizing sample
point selection inside the framework of model order reduction (MOR).
The procedure, based on the maximization of the dimension of the
subspace spanned by the samples, iteratively selects new samples in
an efficient and automatic fashion, without computing the new vectors
and with no prior assumptions on the system behavior. The scheme is
general, and valid for single and multiple dimensions, with
applicability on multi-point nominal MOR approaches, and on
multi-dimensional sampling based parametric MOR methodologies. The
talk will also introduce an integrated algorithm for multi-point MOR,
with automatic sample and order selection based on the transfer
function error estimation. Results on a variety of industrial
examples demonstrate the accuracy and robustness of the technique.

Jorge Fernandez Villena received a degree in
Telecommunication Engineering from the E.S.T.I.I.T. at Universidad de
Cantabria, Spain, in 2005. He is currently working towards a Ph.D.
degree in Electrical and Computer Engineering at the Instituto
Superior Técnico, Technical University of Lisbon, Portugal, and he is
a researcher in the ALGOS Group, at INESC-ID. His research
interests include integrated circuits interconnect modeling and
simulation, with emphasis in numerical algorithms for parametric
model order reduction.

Date and local
Tuesday, July, 21 2009, 11h30, room 336 at INESC-ID, Lisbon.

More info

Seminars page of INESC-ID

Seminar organized by the
ALGOS group (algos.inesc-id.pt)

 

Date: 2009-Jul-21     Time: 11:30:00     Room: 336


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