Fabian Vargas,

PUCRS – Pontifícia Univ. Católica do Rio Grande do Sul


Nowadays, embedded Static Random Memories (SRAMs) can occupy a significant portion of the chip area and contain hundreds of millions of transistors. Due to technology scaling, SRAM functional fault models, traditionally applied in memory testing, have become insufficient to correctly reproduce the effects produced by some defects generated during the manufacturing process. In this seminar, we investigate the possibility to use Built-In Current Sensors (BICSs) in combination with an optimized March algorithm to detect static faults associated to resistive-open defects. Experimental results obtained throughout electrical simulations validate the proposed technique demonstrating its viability and effectiveness.


Date: 2009-Nov-23     Time: 15:30:00     Room: 336

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