BICS-Based March Test for Resistive-Open Defects Detection in SRAM
Fabian Vargas,
PUCRS – Pontifícia Univ. Católica do Rio Grande do Sul –
Abstract:
Nowadays, embedded Static Random Memories (SRAMs) can occupy a significant portion of the chip area and contain hundreds of millions of transistors. Due to technology scaling, SRAM functional fault models, traditionally applied in memory testing, have become insufficient to correctly reproduce the effects produced by some defects generated during the manufacturing process. In this seminar, we investigate the possibility to use Built-In Current Sensors (BICSs) in combination with an optimized March algorithm to detect static faults associated to resistive-open defects. Experimental results obtained throughout electrical simulations validate the proposed technique demonstrating its viability and effectiveness.
Date: 2009-Nov-23 Time: 15:30:00 Room: 336
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INESC Brussels HUB Winter Meeting 2023

This edition of the HUB Winter Meeting will be co-organised with Science Business and will take place on the 30 and 31 January, in Lisbon, at Instituto Superior Técnico, Department of Computer Science and Engineering.
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9h to 10h30 GMT
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Tuesday, 31 January
f) Workshop: How they did it? Strategic positioning for structural success in Horizon Europe: a discussion of best practices.
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