Nuno Guerreiro
Marcelino Bicho dos Santos

Silicongate, Lda


The aim of this paper is to reduce the fault simulation effort required for the evaluation of test effectiveness in mixed-signal circuits. Exhaustive simulation of basic analog and mixed-signal structures in the presence of individual faults is used to identify potentially equivalent faults. Fault equivalence is finally evaluated based on the simulation of all faults in a case study – a DCDC (switched buck converter). The number of transistor stuck-on and stuck-off faults that need to be simulated is reduced to 31% in the structures already processed by the proposed methodology. This approach is a significant contribution to make mixed-signal fault simulation possible as part of the production test preparation.


Date: 2011-Nov-08     Time: 12:30:00     Room: 020

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