Integrated Nano Sensor Probes and Electronics for Eddy C urrents Testing (INSPEC T)

Type: National Project

Duration: from 2013 May 01 to 2015 Apr 30

Financed by: FCT

Prime Contractor: INESC-ID (Other)

This research proposal aims to develop a state of the art Non-Destructive Testing (NDT) system to overcome current testing limitations on some specific industrial applications. The system will include a new eddy currents probe, combining coils, a Magnetoresistive (MR) sensors array and C omplementary Metal-Oxide Semiconductor (C MOS) microelectronic circuits, which will work together with an eddy current generation element. Since the probe aims to be efficient for both superficial (requiring high frequency operation) and buried defects (requiring low frequency operation), coils have the disadvantage of having a frequency dependent sensitivity, which is lower at low requencies. Moreover, coils also have a low spatial resolution, due to itsmillimeters range size. While coils measure magnetic flux, MR sensors measure magnetic field thus having a frequency independent sensitivity.Results will be displayed in a Graphical User Interface (GUI)running on a computer connected with the developed system. C haracterization and testing on real and relevant NDT applications will evaluate the new system performance.


  • INESC MN (Other) - Lisbon, Portugal
  • INESC-ID (Other)

Principal Investigators