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  • BugOut: Automated Test Generation and Bug Detection for Low-Code
    Joana Coutinho, Alexandre Duarte de Almeida Lemos, Miguel Neves, André dos Santos Martins Ribeiro, Vasco Manquinho, Rui Quintino, Bartlomiej Matejczyk
    IEEE International Conference on Software Testing, Verification, and Validation (ICST 2024),

Keywords

Year Published

2024 - 2024

Type

(1)
Conference Paper

Ranking

(1)
Q2 / A

Scope

(1)
International